发明名称 Scan insertion with bypass login in an IC design
摘要 A computer implemented process of inserting enhanced scan bypass in relation to a bypassed block in an integrated circuit design comprising: receiving an HDL description of the circuit design; wherein the HDL description includes a port specification HDL instruction that specifies port properties of a bypassed block; wherein the HDL description includes an enhanced bypass HDL instruction that specifies how many scan cells to provide per port of the bypassed block in a scan bypass circuit that bypasses the bypassed block; wherein the bypass HDL instruction includes a user-selectable option of at least zero or one or two scan cells per port; in response to the specification HDL instruction and the enhanced bypass HDL instruction, automatically generating a netlist portion that includes scan a bypass circuit that bypasses the bypassed block and that includes the specified number of scan cells per port.
申请公布号 US2004015788(A1) 申请公布日期 2004.01.22
申请号 US20030435329 申请日期 2003.05.09
申请人 HUANG STEVE C.;CHEN IHAO 发明人 HUANG STEVE C.;CHEN IHAO
分类号 G01R31/3185;(IPC1-7):G06F17/50 主分类号 G01R31/3185
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