| 发明名称 |
Method for testing a device and a test configuration including a device with a test memory |
| 摘要 |
A test configuration that includes a device and a method for testing the device in which test results determined during the testing of the device are stored in a memory in the device. In this way, the test results are connected with the device and available at any time for later evaluations.
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| 申请公布号 |
US2004015313(A1) |
申请公布日期 |
2004.01.22 |
| 申请号 |
US20010907694 |
申请日期 |
2001.07.18 |
| 申请人 |
BENEDIX ALEXANDER;HARTMANN HENNING;DUREGGER REINHARD;RUF WOLFGANG |
发明人 |
BENEDIX ALEXANDER;HARTMANN HENNING;DUREGGER REINHARD;RUF WOLFGANG |
| 分类号 |
G11C29/44;H01L23/544;(IPC1-7):G01V1/00;G01V1/28;G06F19/00 |
主分类号 |
G11C29/44 |
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