发明名称 FILM FORMING METHOD AND FILM FORMING APPARATUS
摘要 <p>A method for forming a film characterized by comprising the steps of growing a metal film to serve as a lower electrode of a capacitor in a film-forming region on a substrate to be processed, heating the substrate at 350 to 500°C in a non-oxidizing atmosphere, growing a dielectric film in a film-forming region on the metal film, and heat-treating the substrate at 600°C or more. The crystalline grains of the metal film to serve as an underlying film of the dielectric film grows and comes into a stable state by a preliminary heat treatment, and the growth of the crystalline grain is prevented during the heat treatment. Therefore, no defect occurs in the brittle dielectric film, and a high-quality dielectric film can be formed.</p>
申请公布号 WO2004008518(A1) 申请公布日期 2004.01.22
申请号 WO2003JP08803 申请日期 2003.07.10
申请人 TOKYO ELECTRON LIMITED;YAMASAKI, HIDEAKI;ARIMA, SUSUMU;KAWANO, YUMIKO 发明人 YAMASAKI, HIDEAKI;ARIMA, SUSUMU;KAWANO, YUMIKO
分类号 H01L21/3205;C23C16/02;C23C16/56;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L21/8246;H01L23/52;H01L27/105;H01L27/108;(IPC1-7):H01L21/314;H01L27/10 主分类号 H01L21/3205
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