发明名称 |
FILM FORMING METHOD AND FILM FORMING APPARATUS |
摘要 |
<p>A method for forming a film characterized by comprising the steps of growing a metal film to serve as a lower electrode of a capacitor in a film-forming region on a substrate to be processed, heating the substrate at 350 to 500°C in a non-oxidizing atmosphere, growing a dielectric film in a film-forming region on the metal film, and heat-treating the substrate at 600°C or more. The crystalline grains of the metal film to serve as an underlying film of the dielectric film grows and comes into a stable state by a preliminary heat treatment, and the growth of the crystalline grain is prevented during the heat treatment. Therefore, no defect occurs in the brittle dielectric film, and a high-quality dielectric film can be formed.</p> |
申请公布号 |
WO2004008518(A1) |
申请公布日期 |
2004.01.22 |
申请号 |
WO2003JP08803 |
申请日期 |
2003.07.10 |
申请人 |
TOKYO ELECTRON LIMITED;YAMASAKI, HIDEAKI;ARIMA, SUSUMU;KAWANO, YUMIKO |
发明人 |
YAMASAKI, HIDEAKI;ARIMA, SUSUMU;KAWANO, YUMIKO |
分类号 |
H01L21/3205;C23C16/02;C23C16/56;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L21/8246;H01L23/52;H01L27/105;H01L27/108;(IPC1-7):H01L21/314;H01L27/10 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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