发明名称 MIXED FREQUENCY HIGH TEMPERATURE NITRIDE CVD PROCESS
摘要 A mixed-frequency, high temperature PECVD process is utilized to create a high quality silicon nitride layer having highly conformal properties. Deposition in an ammonia rich ambient at high temperature reduces microloading between dense and isolated features by improving surface mobility of precursors. High quality nitride films formed by the instant process are particularly suited for front-end applications such as the formation of spacer structures and the formation of contact etch stop layers.
申请公布号 WO03089681(A3) 申请公布日期 2004.01.22
申请号 WO2003US12437 申请日期 2003.04.17
申请人 APPLIED MATERIALS, INC. 发明人 TANG, SUM-YEE, BETTY;WANG, YUXIANG, MAY;D'CRUZ, LESTER
分类号 C23C16/34;C23C16/505;H01L21/318 主分类号 C23C16/34
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