METHOD FOR TESTING THE ERROR RATIO OF A DEVICE

摘要

A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BER_limit with a early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns bits of the output of the device are measured, thereby ne erroneous bits of the ns bits are detected. PD_high and/or PD_low are obtained, whereby PD_high is the worst possible likelihood distribution and PD_low is the best possible likelihood distribution containing the measured ne erroneous bits with the probablility D. The average numbers of erroneous bits NE_high and NE_low for PD_high and PD_low are obtained. NE_high and NE_low are compared with NE_limit=BER_limitxns. If NE_limit is higher than NE_high or NE_limit is lower than NE_low the test is stopped.