发明名称 METHOD FOR MANUFACTURING FLASH MEMORY
摘要 PURPOSE: A method for manufacturing a flash memory is provided to prevent the reduction of source resistance by implanting phosphorous ions into a source/drain region. CONSTITUTION: A tunnel oxide layer(404), a floating gate(406), a dielectric film(408), a control gate(410) and an anti-reflective coating layer are sequentially formed on a semiconductor substrate(402). A common source line is formed by using SAS(Self Aligned Source) etching. Arsenic ions and phosphorous ions are sequentially implanted into a source/drain forming region. Then, a contact plug and a metal interconnection are formed on the resultant structure.
申请公布号 KR20040005231(A) 申请公布日期 2004.01.16
申请号 KR20020039719 申请日期 2002.07.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, SEONG MUN;KIM, JEOM SU;LEE, YEONG BOK
分类号 H01L21/8247;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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