发明名称 |
METHOD FOR MANUFACTURING FLASH MEMORY |
摘要 |
PURPOSE: A method for manufacturing a flash memory is provided to prevent the reduction of source resistance by implanting phosphorous ions into a source/drain region. CONSTITUTION: A tunnel oxide layer(404), a floating gate(406), a dielectric film(408), a control gate(410) and an anti-reflective coating layer are sequentially formed on a semiconductor substrate(402). A common source line is formed by using SAS(Self Aligned Source) etching. Arsenic ions and phosphorous ions are sequentially implanted into a source/drain forming region. Then, a contact plug and a metal interconnection are formed on the resultant structure.
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申请公布号 |
KR20040005231(A) |
申请公布日期 |
2004.01.16 |
申请号 |
KR20020039719 |
申请日期 |
2002.07.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUNG, SEONG MUN;KIM, JEOM SU;LEE, YEONG BOK |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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地址 |
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