发明名称 |
FLASH MEMORY DEVICE HAVING SELF-ALIGNED SHALLOW TRENCH ISOLATION AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A flash memory device having a self-aligned STI(Shallow Trench Isolation) and a manufacturing method thereof are provided to be capable of preventing a bird's beak from being formed at the edge portion of a tunnel oxide pattern. CONSTITUTION: A flash memory device is provided with a semiconductor substrate(100), a tunnel oxide pattern formed at the predetermined upper portion of the substrate, and a floating gate pattern(150) formed at the upper portion of the tunnel oxide layer. The floating gate pattern includes a trench region(112a) adjacent to the tunnel oxide pattern. The flash memory device further includes a trench oxide layer(118) and an isolating pattern(120) formed at the upper portion of the trench oxide layer. At this time, a nitrogen doping layer is formed at each surface of the sequentially aligned sidewalls for the floating gate pattern and the trench region.
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申请公布号 |
KR20040004797(A) |
申请公布日期 |
2004.01.16 |
申请号 |
KR20020038826 |
申请日期 |
2002.07.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHANG HYEON;PARK, DONG GEON |
分类号 |
H01L21/76;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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