发明名称 FLASH MEMORY DEVICE HAVING SELF-ALIGNED SHALLOW TRENCH ISOLATION AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A flash memory device having a self-aligned STI(Shallow Trench Isolation) and a manufacturing method thereof are provided to be capable of preventing a bird's beak from being formed at the edge portion of a tunnel oxide pattern. CONSTITUTION: A flash memory device is provided with a semiconductor substrate(100), a tunnel oxide pattern formed at the predetermined upper portion of the substrate, and a floating gate pattern(150) formed at the upper portion of the tunnel oxide layer. The floating gate pattern includes a trench region(112a) adjacent to the tunnel oxide pattern. The flash memory device further includes a trench oxide layer(118) and an isolating pattern(120) formed at the upper portion of the trench oxide layer. At this time, a nitrogen doping layer is formed at each surface of the sequentially aligned sidewalls for the floating gate pattern and the trench region.
申请公布号 KR20040004797(A) 申请公布日期 2004.01.16
申请号 KR20020038826 申请日期 2002.07.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHANG HYEON;PARK, DONG GEON
分类号 H01L21/76;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/76 主分类号 H01L21/76
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