发明名称 APPARATUS FOR MEASURING RESIDUAL STRESS OF OPTICAL PREFORM
摘要 PURPOSE: An apparatus for measuring residual stress of an optical preform is provided to measure the stress heterogeneity of the preform by transmitting the laser beams into various directions of the optical preform. CONSTITUTION: An apparatus for measuring stress of an optical preform includes a laser beam source(10), a beam splitter(300), the first optical path converters(320) of N number, the first polarizers(50,51) of N number, the first beam condensers(60,61) of N number, analyzers(90,91) of N number, the second optical path converters(330,331) of L numbers, the second beam condenser(340), and an optical sensor(100). The beam splitter(300) is used for dividing the laser beam of the laser beam source(10) into laser beams of N number. The first optical path changers(320) of N number are used for changing each path of the divided beams. The first polarizers(50,51) of N number are used for changing the polarization of the laser beams. The first beam condensers(60,61) of N number are used for condensing the laser beam to an optical preform. The analyzers(90,91) of N number are used for converting phase differences of the laser beams according to the residual stress of the optical preform. The second optical path changers(330,331) of L numbers are used for correcting the paths of the laser beams through the analyzers(90,91). The second beam condenser(340) is used for condensing the laser beams through the second optical path changers(330,331). The optical sensor(100) is used for converting the intensity of the laser beams to electric signals.
申请公布号 KR20040005253(A) 申请公布日期 2004.01.16
申请号 KR20020039741 申请日期 2002.07.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JAE HO;OH, SEONG GUK
分类号 G02B6/00;(IPC1-7):G02B6/00 主分类号 G02B6/00
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