发明名称 Method of 193 NM photoresist stabilization by the use of ion implantation
摘要 A method of forming a photoresist includes forming a photoresist and patterning/developing it according to conventional methods. The photoresist is then subjected to ion implantation. The ions may be selected from the group consisting of argon, boron, boron fluoride, arsenic, phosphorous and nitrogen. The ion implantation during processing of the photoresist provides a stabilized photoresist and helps reduce CD loss, loss of the photoresist and formation of pin holes and striations.
申请公布号 US2004009437(A1) 申请公布日期 2004.01.15
申请号 US20020191546 申请日期 2002.07.10
申请人 CHUN JUN SUNG;SEDIGH MEHRAN;FORD CHRIST 发明人 CHUN JUN SUNG;SEDIGH MEHRAN;FORD CHRIST
分类号 G03F7/40;H01L21/027;H01L21/311;(IPC1-7):G03F7/16;G03F7/20;H01L21/20;H01L21/31;H01L21/36;H01L21/469 主分类号 G03F7/40
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