发明名称 MULTIRATE PROCESSING FOR METROLOGY OF PLASMA RF SOURCE
摘要 An RF generator is provided for use in an RF plasma system. The RF generator includes: a power source that is operable to generate RF power signals at a tuned frequency; a sensor unit that is adapted to detect the RF power signals and operable to generate analog signals representative of the RF power signals, where the analog signals include a frequency of interest and a plurality of interfering frequency components; and a sensor signal processing unit that is adapted to receive the analog signals from the sensor unit and to band limit the analog signals within a predefined bandwidth that passes the frequency of interest and rejects interfering frequency components.
申请公布号 US2004007984(A1) 申请公布日期 2004.01.15
申请号 US20020192196 申请日期 2002.07.10
申请人 COUMOU DAVID J.;KIRK MICHAEL L. 发明人 COUMOU DAVID J.;KIRK MICHAEL L.
分类号 H05H1/46;H01J37/32;H01L21/3065;H03H17/06;(IPC1-7):H01J7/24 主分类号 H05H1/46
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