| 摘要 |
PROBLEM TO BE SOLVED: To generate various test patterns from algorizm pattern data of a few bit numbers. SOLUTION: The test pattern generator generates test patterns for testing an electronic device composed of a fundamental pattern generating part for generating fundamental pattern data, an algorithm pattern generating part for generating algorithm pattern data based on a previously fixed algorithm, an operation pattern generating part for generating the operation pattern data by operating the operation selected from among a plurality of operations for the fundamental pattern data and the algorithm pattern data, and a test pattern outputting part for outputting the test pattern based on the operation pattern data. COPYRIGHT: (C)2004,JPO
|
