| 摘要 |
PROBLEM TO BE SOLVED: To realize a pixel inspection device and a pixel inspection method that precisely inspect at least a defect of pixel even when the number of photoreceiving elements to one pixel of a display equipment to be inspected is small. SOLUTION: This device of the present invention is an improved pixel inspection device wherein a desired inspection pattern is displayed on the display equipment to be inspected, wherein light from the pixel of the display equipment is detected by a plurality of photoreceiving elements, and wherein the defect of the pixel of the display equipment is inspected. This device is characterized in that it is provided with a shift correction means for correcting a brightness level from the photoreceiving element based on a positional relation of mapping between the pixel of the display equipment and the photoreceiving element, a brightness correcting means for correcting the brightness level corrected by the correction means based on a response characteristic of the light from the pixel of the display equipment to the photoreceivng element, and a judging means for judging the defect of the pixel based on the corrected brightness level corrected by the brightness correcting means and the inspection pattern. COPYRIGHT: (C)2004,JPO
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