发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF TESTING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device or the like capable of measuring a rest power source current measured in a short time. SOLUTION: A pad 41 to which the first power source potential is supplied, and a pad 42 connected with one end of an external capacitor 3 are connected to the other end of the capacitor 3. This device is provided with a pad 43 to which the second power source potential is supplied, a pad 44 input with an input signal, the first power source potential supply line 21 connected to the pad 41, and the second power source potential supply line 22 connected to the pad 43. The device is also provided with a control circuit 31 for outputting a control signal in response to a test signal, an inverter 32 for inverting the control signal to be output, an inverter 33 for inverting an output signal of the inverter 32 to be output, and an analog switch 34 brought into off condition when the signal output from the inverter 33 is a high level and when the signal output from the inverter 32 is a low level, and turned on when the signal output from the inverter 33 is a low level and when the signal output from the inverter 32 is a high level. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004012252(A) 申请公布日期 2004.01.15
申请号 JP20020164910 申请日期 2002.06.05
申请人 SEIKO EPSON CORP 发明人 SANO MASATOSHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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