发明名称 FORMING METHOD FOR SILICON-BASED THIN FILM AND ELEMENT HAVING FORMED FILM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a high-performance, stable forming method of a silicon-based thin film for securing high productivity. <P>SOLUTION: In the forming method of the silicon-based thin film, under an atmospheric pressure or pressure close to the atmospheric pressure, a power of at least 1W/cm<SP>2</SP>with a high-frequency voltage exceeding 100 kHz is supplied between opposite electrodes for discharging, thus changing a reactive gas into plasm, allowing a base to be exposed to the reactive gas changed into the plasma, and hence forming the thin film on the base. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004014846(A) 申请公布日期 2004.01.15
申请号 JP20020167086 申请日期 2002.06.07
申请人 KONICA MINOLTA HOLDINGS INC 发明人 FUKUDA KAZUHIRO;MOROHOSHI YASUO;OISHI KIYOSHI
分类号 H01L21/205;H01L31/04;(IPC1-7):H01L21/205 主分类号 H01L21/205
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