发明名称 SEED FILM AND FORMING METHOD THEREOF, Cu WIRE AND FORMING METHOD THEREOF, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, AND MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance the burying property into a recessed part provided on a substrate in the case of forming a Cu wire on the substrate. SOLUTION: After a Ti film is formed on a wafer W provided with an insulation layer 110 formed with the recessed part T on a Si conductive substrate layer 100, a barrier film 101 is formed by the MOCVD method. Then a seed film 102 made of a Cu-Al alloy is deposited without applying plasma processing to the barrier film 101. Further, a Cu film 103 is formed on the seed film 102 by the plating processing to form the Cu wire. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004014626(A) 申请公布日期 2004.01.15
申请号 JP20020163184 申请日期 2002.06.04
申请人 APPLIED MATERIALS INC 发明人 GOTO KYOJI
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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