发明名称 |
SEED FILM AND FORMING METHOD THEREOF, Cu WIRE AND FORMING METHOD THEREOF, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, AND MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To enhance the burying property into a recessed part provided on a substrate in the case of forming a Cu wire on the substrate. SOLUTION: After a Ti film is formed on a wafer W provided with an insulation layer 110 formed with the recessed part T on a Si conductive substrate layer 100, a barrier film 101 is formed by the MOCVD method. Then a seed film 102 made of a Cu-Al alloy is deposited without applying plasma processing to the barrier film 101. Further, a Cu film 103 is formed on the seed film 102 by the plating processing to form the Cu wire. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004014626(A) |
申请公布日期 |
2004.01.15 |
申请号 |
JP20020163184 |
申请日期 |
2002.06.04 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
GOTO KYOJI |
分类号 |
H01L21/768;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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