发明名称 Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus
摘要 Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.
申请公布号 US2004008816(A1) 申请公布日期 2004.01.15
申请号 US20030457354 申请日期 2003.06.10
申请人 RIGAKU CORPORATION. 发明人 HOSHINO KAZUHITO;IWASAKI YOSHIO
分类号 G01N23/201;(IPC1-7):G01N23/201 主分类号 G01N23/201
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