发明名称 X-RAY INSPECTION BY COHERENT-SCATTERING FROM VARIABLY DISPOSED SCATTERERS IDENTIFIED AS SUSPECT OBJECTS
摘要 <p>A system and method for inspecting an object. The system has a source for generating a penetrating radiation beam for irradiating the object and at least one detector for detecting the beam after the beam interacts with the object. Furthermore, the system has an aperture interposed between the source and the object, the aperture characterized by a cross-sectional dimension, and the cross-sectional dimension capable of variation on a periodic basis during the course of inspecting the object such that high resolution is obtained for regions of object characterized by lower opacity while penetration is achieved at lower spatial resolution for regions of more substantial opacity.</p>
申请公布号 WO2004005905(A1) 申请公布日期 2004.01.15
申请号 WO2003US21199 申请日期 2003.07.07
申请人 AMERICAN SCIENCE AND ENGINEERING, INC. 发明人 GRODZINS, LEE;ADAMS, WILLIAM;ROTHSCHILD, PETER
分类号 G01N23/20;G01N23/201;G01V5/00;(IPC1-7):G01N23/20 主分类号 G01N23/20
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