发明名称 Method of preventing particle generation in plasma cleaning
摘要 A method to prevent particle generation from sputtering clean is disclosed. the method comprises of forming a dielectric layer on a substrate, forming a nitrogen-containing dielectric layer on the dielectric layer, forming a plurality of contact holes in the dielectric layer and the nitrogen-containing dielectric layer, coating a sacrificial layer into the contact holes and on the nitrogen-containing dielectric layer, removing the sacrificial layer and the nitrogen-containing dielectric layer on top of the dielectric layer, removing said sacrificial layer in said contact holes and performing an argon sputtering clean.
申请公布号 US2004009660(A1) 申请公布日期 2004.01.15
申请号 US20020194630 申请日期 2002.07.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIU CHUNG-SHI;SHUE SHAU-LIN;YA CHEN-HUA
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
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