发明名称 Embedded ROM device using substrate leakage
摘要 A ROM embedded DRAM provides ROM cells that can be programmed to a single state. The ROM cells include capacitors having a storage node. The storage node is processed to have a substantially high substrate leakage. The ROM cells, therefore, are hard programmed to a logic zero state. Bias techniques can be used to read un-programmed ROM cells accurately. As described, sense amplifier circuitry can be offset in one embodiment to default to the un-programmed state. In another embodiment, bias circuitry is coupled to bit lines to favor the un-programmed state. A differential pre-charge operation can also be used in another embodiment.
申请公布号 US2004008534(A1) 申请公布日期 2004.01.15
申请号 US20020194549 申请日期 2002.07.11
申请人 MICRON TECHNOLOGY, INC. 发明人 KURTH CASEY;DERNER SCOTT;WALD PHILLIP G.
分类号 G11C11/00;H01L21/8239;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;(IPC1-7):G11C11/24;G11C16/04 主分类号 G11C11/00
代理机构 代理人
主权项
地址