| 摘要 |
PROBLEM TO BE SOLVED: To provide a chip test machine for testing all 6 surfaces by using a still belt and linearly moving the chip and automatically selecting chips. SOLUTION: The chip test machine for testing all 6 surfaces comprises a still belt including a first test part for simultaneously testing 3 surfaces of the chip, a reversal device for reversing the chips discharged out of the first test part, and a second test part for simultaneously testing another 3 surfaces of the chips reversed by the reversal device. COPYRIGHT: (C)2004,JPO
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