发明名称 |
Reliable comparison circuit in an automatic test equipment |
摘要 |
A semiconductor apparatus is composed of a signal providing circuit and a data analyzer. The signal providing circuit provides an input signal set including at least one input signal. The data analyzer outputs a digital result signal in synchronization with a clock signal. The data analyzer inverts the digital result signal at a timing indicated by the clock signal while the input signal set is in a predetermined state, and does not invert the digital result signal while the input signal set is not in the predetermined state. <IMAGE> |
申请公布号 |
EP1197759(A3) |
申请公布日期 |
2004.01.14 |
申请号 |
EP20010123158 |
申请日期 |
2001.09.27 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
NAKAMURA, YOSHIYUKI |
分类号 |
G01R31/28;G01R31/3193;G11C29/56 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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