发明名称 WAFER TRANSFER STATE CHECKING APPARATUS OF WAFER TRANSFER ROBOT AND METHOD THEREOF
摘要 PURPOSE: A wafer transfer state checking apparatus of a wafer transfer robot and a method thereof are provided to be capable of detecting the contact between a robot arm and an unexpected wafer and generating an interlock signal when transferring an aiming wafer. CONSTITUTION: A wafer transfer state checking apparatus is provided with a transfer robot(10) having a robot arm(12) for transferring a wafer between a carrier(16) and a process module and a contact sensor(18) installed at the lower portion of the robot arm for detecting the contact state of an unexpected wafer. The wafer transfer state checking apparatus further includes a controller(20) for receiving a contact state detecting signal from the contact sensor and outputting an interlock generating signal and an alarm generation controlling signal.
申请公布号 KR20040003309(A) 申请公布日期 2004.01.13
申请号 KR20020037974 申请日期 2002.07.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG HWA
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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