发明名称 Method for filling trenches in integrated semiconductor circuits
摘要 A method in which a recess is formed in the surface of a semiconductor substrate and a material is grown on the inner wall of the recess, includes the steps of producing an electrically insulating layer on the surface of the substrate outside the recess, and selectively growing the material on the inner wall of the recess as a result of the substrate, as an electrode, being brought into contact with an electrolysis liquid and electrolysis being carried out, during which the insulating layer prevents the material from growing outside the recess. Before the electrolysis is carried out, a reserve material is epitaxially deposited on the inner wall of the recess and, during the electrolysis, the reserve material is converted into the material being grown by electrolysis.
申请公布号 US6677218(B2) 申请公布日期 2004.01.13
申请号 US20020210374 申请日期 2002.07.31
申请人 INFINEON TECHNOLOGIES AG 发明人 KIRCHHOFF MARKUS;SCHREMS MARTIN
分类号 H01L21/316;H01L21/762;H01L21/8242;(IPC1-7):H01L21/762 主分类号 H01L21/316
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