发明名称 METHOD FOR MANUFACTURING PHASE SHIFT MASK
摘要 PURPOSE: A method for manufacturing a phase shift mask is provided to simplify processes and to reduce manufacturing costs by forming a spacer at the sidewall of a light shielding pattern. CONSTITUTION: A light shielding layer and a photoresist layer are sequentially formed on a transparent substrate(100). A photoresist pattern is formed to expose a desired region of the light shielding layer. A light shielding pattern(140) is formed by etching the light shielding layer using the photoresist pattern as a mask. A spacer(150) is formed at both sidewalls of the light shielding pattern(140). Nitride or oxide is used as the spacer.
申请公布号 KR20040003653(A) 申请公布日期 2004.01.13
申请号 KR20020038405 申请日期 2002.07.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, GI YEOP
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
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