发明名称 DEVICE FOR TESTING SLIC IC AND SLAC IC OF FULL ELECTRONIC EXCHANGE SUBSCRIBER BOARD
摘要 PURPOSE: A device for testing an SLIC(Subscriber Line Interface Circuit) IC and an SLAC(Subscriber Line Audio Processing Circuit) IC of a full electronic exchange subscriber board is provided to enable a tester to confirm whether the first SLIC ICs and the first/second SLAC ICs are normal by a measured AC voltage and a DC, thereby easily testing the SLIC ICs and the SLAC ICs. CONSTITUTION: The first test device(110) generates a 2-line signal, and measures an AC voltage and a DC of the signal. The first SLIC IC(120) converts the 2-line signal into a 4-line signal, or converts an external 4-line signal into a 2-line signal, and outputs the 2-line signal. The first SLAC IC(130) converts the 4-line signal into a PCM signal, or converts an external PCM signal into a 4-line signal, and outputs the 4-line signal. The second SLAC IC(140) converts the PCM signal into a 4-line signal, or converts an external 4-line signal into a PCM signal, and outputs the PCM signal. The second SLIC IC(150) converts the 4-line signal into a 2-line signal, or converts an external 2-line signal into a 4-line signal, and outputs the 4-line signal. The second test device(160) measures an AC voltage and a DC of the 2-line signal, or generates a 2-line signal to output the signal. A control IC(170) inputs data for initializing, and initializes the first SLAC IC(130) and the second SLAC IC(140).
申请公布号 KR20040003407(A) 申请公布日期 2004.01.13
申请号 KR20020038097 申请日期 2002.07.03
申请人 LG INNOTEC CO., LTD. 发明人 CHOI, JIN BONG;KIM, GWAN U
分类号 H04Q1/20;(IPC1-7):H04Q1/20 主分类号 H04Q1/20
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