发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to be capable of effectively preventing the generation of junction short between a source and drain in a bulk area, for obtaining good electrical characteristics of an MOS(Metal Oxide Semiconductor) transistor. CONSTITUTION: A semiconductor device is provided with a semiconductor substrate(100), isolation layers(110) formed at the upper portion of the semiconductor substrate for defining a device formation region, an epitaxial silicon layer(130) formed between the isolation layers at the upper portion of the semiconductor substrate, and a blocking insulating layer(125) formed at the inner portion of the epitaxial silicon layer for dividing the device formation region into a plurality of portions. The semiconductor device further includes a gate(150) formed at the upper portion of the blocking insulating layer, and a source and drain junction(105) formed at both sides of the gate at the inner portion of the epitaxial silicon layer.
|
申请公布号 |
KR20040003082(A) |
申请公布日期 |
2004.01.13 |
申请号 |
KR20020034150 |
申请日期 |
2002.06.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JI YEONG;PARK, YONG JIK |
分类号 |
H01L29/78;H01L21/336;H01L29/06;H01L29/10;(IPC1-7):H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|