发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a method for manufacturing the same are provided to be capable of effectively preventing the generation of junction short between a source and drain in a bulk area, for obtaining good electrical characteristics of an MOS(Metal Oxide Semiconductor) transistor. CONSTITUTION: A semiconductor device is provided with a semiconductor substrate(100), isolation layers(110) formed at the upper portion of the semiconductor substrate for defining a device formation region, an epitaxial silicon layer(130) formed between the isolation layers at the upper portion of the semiconductor substrate, and a blocking insulating layer(125) formed at the inner portion of the epitaxial silicon layer for dividing the device formation region into a plurality of portions. The semiconductor device further includes a gate(150) formed at the upper portion of the blocking insulating layer, and a source and drain junction(105) formed at both sides of the gate at the inner portion of the epitaxial silicon layer.
申请公布号 KR20040003082(A) 申请公布日期 2004.01.13
申请号 KR20020034150 申请日期 2002.06.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JI YEONG;PARK, YONG JIK
分类号 H01L29/78;H01L21/336;H01L29/06;H01L29/10;(IPC1-7):H01L21/336 主分类号 H01L29/78
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