发明名称 TEST SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a test system monitoring a lamp showing the anomaly or outage of an IC tester and providing continuous monitoring for problems needing immediate countermeasures when there is an anomaly or outage without looking at the lamp directly. <P>SOLUTION: The IC tester 1 is for testing an object to be tested. The state of the IC tester 1 is sent to a server via a network L, the state is sent to a portable terminal carried by a maintenance person by radio, and the operation of a conveyance device in the IC tester 1 is controlled from the portable terminal. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004005414(A) 申请公布日期 2004.01.08
申请号 JP20030021626 申请日期 2003.01.30
申请人 YOKOGAWA ELECTRIC CORP 发明人 TATENO KAZUHIKO;YANAGAWA TSUTOMU;MOTOOKA RYUTA;KAWAKATSU ATSUSHI;TAGAWA MASAMITSU
分类号 G01R31/26;G01R31/28;G06F11/22 主分类号 G01R31/26
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