发明名称 METHOD OF ANALYZING PROBE SUPPORT BY USING FLYING TIME SECONDARY ION MASS SPECTROMETRY
摘要 <p>It is intended to provide a method of analyzing a measurement sample whereby the conditions of a probe located on a support and the occurrence/non-occurrence of the formation of a hybrid of the probe with a target nucleic acid (for example, imaging of the locations and quantitative analysis thereof) can be accurately analyzed. Namely, the conditions of a nucleic acid probe formed in a measurement sample in which a sample is reacted with a probe support and the occurrence/non-occurrence of the formation of a hybrid of the probe with a target nucleic acid are analyzed by the flying time secondary ion mass spectrometry in a state labeled with a label capable of forming a fragment ion which is not formed by the fragmentation of the probe and/or the target.</p>
申请公布号 WO2004003532(A1) 申请公布日期 2004.01.08
申请号 WO2003JP08104 申请日期 2003.06.26
申请人 CANON KABUSHIKI KAISHA;OKAMOTO, TADASHI;TAKASE, HIROMITSU;HASHIMOTO, HIROYUKI 发明人 OKAMOTO, TADASHI;TAKASE, HIROMITSU;HASHIMOTO, HIROYUKI
分类号 C12Q1/68;G01N23/225;(IPC1-7):G01N23/225;G01N33/53 主分类号 C12Q1/68
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