发明名称 |
METHOD OF ANALYZING PROBE SUPPORT BY USING FLYING TIME SECONDARY ION MASS SPECTROMETRY |
摘要 |
<p>It is intended to provide a method of analyzing a measurement sample whereby the conditions of a probe located on a support and the occurrence/non-occurrence of the formation of a hybrid of the probe with a target nucleic acid (for example, imaging of the locations and quantitative analysis thereof) can be accurately analyzed. Namely, the conditions of a nucleic acid probe formed in a measurement sample in which a sample is reacted with a probe support and the occurrence/non-occurrence of the formation of a hybrid of the probe with a target nucleic acid are analyzed by the flying time secondary ion mass spectrometry in a state labeled with a label capable of forming a fragment ion which is not formed by the fragmentation of the probe and/or the target.</p> |
申请公布号 |
WO2004003532(A1) |
申请公布日期 |
2004.01.08 |
申请号 |
WO2003JP08104 |
申请日期 |
2003.06.26 |
申请人 |
CANON KABUSHIKI KAISHA;OKAMOTO, TADASHI;TAKASE, HIROMITSU;HASHIMOTO, HIROYUKI |
发明人 |
OKAMOTO, TADASHI;TAKASE, HIROMITSU;HASHIMOTO, HIROYUKI |
分类号 |
C12Q1/68;G01N23/225;(IPC1-7):G01N23/225;G01N33/53 |
主分类号 |
C12Q1/68 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|