发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit guaranteed to operate under a low temperature environment. SOLUTION: A functional circuit 12, a control circuit 13 for controlling the operation and output of the functional circuit 12, and a temperature detecting element 14 for detecting a temperature of the functional circuit 12 are formed in the whole semiconductor integrated circuit 11. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004006473(A) |
申请公布日期 |
2004.01.08 |
申请号 |
JP20020159088 |
申请日期 |
2002.05.31 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ISHIKAWA KAZUFUMI;YOSHIDA KAZUHIRO;MIZOBATA KYOHIKO |
分类号 |
H01L27/04;H01L21/822;(IPC1-7):H01L21/822 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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