发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit guaranteed to operate under a low temperature environment. SOLUTION: A functional circuit 12, a control circuit 13 for controlling the operation and output of the functional circuit 12, and a temperature detecting element 14 for detecting a temperature of the functional circuit 12 are formed in the whole semiconductor integrated circuit 11. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004006473(A) 申请公布日期 2004.01.08
申请号 JP20020159088 申请日期 2002.05.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ISHIKAWA KAZUFUMI;YOSHIDA KAZUHIRO;MIZOBATA KYOHIKO
分类号 H01L27/04;H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L27/04
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