发明名称 Flash memory devices having self aligned shallow trench isolation structures and methods of fabricating the same
摘要 Flash memory devices are provided including an integrated circuit substrate and a stack gate structure on the integrated circuit substrate. A trench isolation region is provided on the integrated circuit substrate adjacent the stack gate structure. A portion of the stack gate structure adjacent a trench sidewall of the trench isolation region may include a first nitrogen doped layer.
申请公布号 US2004004265(A1) 申请公布日期 2004.01.08
申请号 US20030455679 申请日期 2003.06.05
申请人 LEE CHANG-HYUN;PARK DONG-GUN 发明人 LEE CHANG-HYUN;PARK DONG-GUN
分类号 H01L21/76;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L29/00 主分类号 H01L21/76
代理机构 代理人
主权项
地址