发明名称 METHOD FOR DETERMINING THE CRITICAL PATH OF AN INTEGRATED CIRCUIT
摘要 in order to determine the critical path of a circuit, firstly the paths, the mean path runtimes and the path runtime variations thereof are determined. Paths with similar statistical parameters are collated into path groups. A statistical group figure for each path group and a statistical total figure for all paths considered are than calculated. Finally the critical path is determined by means of a comparison of the group figures at or above a critical path runtime Tc taking into account the total figure.
申请公布号 WO02056208(A3) 申请公布日期 2004.01.08
申请号 WO2001DE04957 申请日期 2001.12.28
申请人 INFINEON TECHNOLOGIES AG;BERTHOLD, JOERG;LORCH, HENNING;EISELE, MARTIN 发明人 BERTHOLD, JOERG;LORCH, HENNING;EISELE, MARTIN
分类号 G06F17/50 主分类号 G06F17/50
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