发明名称 Exposure apparatus and exposure method for use in forming a pattern of a semiconductor device
摘要 An exposure apparatus for exposing a photoresist film formed on a semiconductor substrate includes a plurality of reticle stages on which respective reticles can be supported at the same time. The reticles can be selectively and hence, successively, positioned along the optical axis of the apparatus that extends from the light source of the apparatus to a substrate stage. One region of the photoresist film is exposed to light directed through the first reticle. Then the second reticle stage is aligned and another region of the photoresist film is exposed to light directed through the second reticle.
申请公布号 US2004004700(A1) 申请公布日期 2004.01.08
申请号 US20030419954 申请日期 2003.04.22
申请人 PARK TAE-SIN;LEE BONG-KI 发明人 PARK TAE-SIN;LEE BONG-KI
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03B27/42 主分类号 G03F7/20
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