发明名称 Method for fabricating semiconductor device
摘要 A fluorine-containing organic film having a relative dielectric constant of 4 or less is deposited on a semiconductor substrate using a material gas containing C5F8, C3F6, or C4F6 as a main component.
申请公布号 US2004005789(A1) 申请公布日期 2004.01.08
申请号 US20030600606 申请日期 2003.06.23
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 JIWARI NOBUHIRO;IMAI SHINICHI
分类号 H01L21/302;B05D5/08;B05D7/24;C23C16/26;C23C16/30;H01L21/28;H01L21/3065;H01L21/31;H01L21/311;H01L21/312;H01L21/3213;H01L21/768;H01L23/522;(IPC1-7):H01L21/476;H01L21/469 主分类号 H01L21/302
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