TEST PLATE FOR CERAMIC SURFACE MOUNT DEVICES AND OTHER ELECTRONIC COMPONENTS

摘要

A test plate (10) for holding miniature electronic circuit components as a part of batch processing for parametric testing purposes, including passive, two-terminal, ceramic capacitators, resistors, multilayer inductors, inductor beads, varistors, thermistors, fuses, sensors, actuators, and the like, or another type of device under test (DUT), includes a multilayer DUT-holding plate (10) having a rotational axis (15) and at least two layers (11), (14) centered on the rotational axis (15). A conductive layer (14) of the two layers includes oversize holes in alignment with DUT-engaging holes in a nonconductible layer (11) of the two layers that enable use of the first conductive layer (14) as guard layer held at a guard potential for electrical testing purposes in order to eliminate or at least significantly reduce the effects of stray impedances on test results. Additional conductive guard layers (13) and nonconductive layers (12) may be included. Conductive layers (13), (14) may take the form of conductive patterns etched into copper laminates on nonconductive layers (11), (12) composed of epoxy printed circuit board material.