发明名称 METHOD FOR MANUFACTURING RETICLE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a reticle for manufacturing device patterns by using positive resist in a manner as not to allow light shielding layers acting as the sources for generation of foreign substances to remain at the peripheries etc. of a substrate. <P>SOLUTION: The method for manufacturing the reticle has at least a device pattern forming step for applying the positive resist to the device pattern forming regions of the light shielding layers formed on the substrate and irradiating the positive acting resist with energy rays, then developing the resist to form the pattern like positive resist and an alignment pattern forming step for applying the negative resist to the alignment pattern forming regions of the light shielding layers and irradiating the negative resist with the energy rays, then developing the resist to form the pattern like negative resist. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004004715(A) 申请公布日期 2004.01.08
申请号 JP20030101172 申请日期 2003.04.04
申请人 DAINIPPON PRINTING CO LTD 发明人 HOGEN MORIHISA;SASAKI SHIHO;FUJII AKIKO
分类号 G03F1/38;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/38
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