发明名称 |
NITRIDE GROUP SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD THEREOF |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a nitride group semiconductor element whereby contact resistance between an electrode and a nitrogen side of a nitride group semiconductor substrate or the like can be reduced. <P>SOLUTION: The manufacturing method of the nitride group semiconductor element includes steps of etching the rear side (nitrogen side) of an n-type GaN substrate 1 with a wurtzite structure by an RIE (reactive ion etching) method, and then forming an n-side electrode 8 on the rear side (nitrogen side) of the etched n-type GaN substrate 1. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004006718(A) |
申请公布日期 |
2004.01.08 |
申请号 |
JP20030074966 |
申请日期 |
2003.03.19 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
TODA TADAO;HATA MASAYUKI;YAMAGUCHI TSUTOMU;NOMURA YASUHIKO |
分类号 |
H01L21/3065;H01L21/306;H01L33/16;H01L33/32;H01L33/62;H01S5/323;H01S5/343 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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