发明名称 INSULATED GATE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a power MOSFET which is high in speed and is most primarily characterized by having the capability of suppressing switching noise. SOLUTION: For example, the power MOSFET comprises a plurality of p base layers 12 which are selectively formed on the surface of an n<SP>-</SP>drift layer 11, an n<SP>+</SP>source layer 13 formed on the surface of each p base layer 12, an n<SP>+</SP>drain layer 15 formed on the rear face side of the n<SP>-</SP>drift layer 11, drain electrode 21 connected to the n<SP>+</SP>drain layer 15, a plurality of source electrodes 22 connected to the p base layers 12 and to the n<SP>+</SP>source layer 13, a gate electrode 24 formed between the source electrodes 22 via a gate insulation film 23, and a p layer 14 which is selectively formed on the surface of the n<SP>-</SP>drift layer 11 below the gate electrode 24 while being connected to one of the p base layers 12 and having a lower impurity concentration than the p base layer has. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004006598(A) 申请公布日期 2004.01.08
申请号 JP20020298838 申请日期 2002.10.11
申请人 TOSHIBA CORP 发明人 SAITO WATARU;OMURA ICHIRO;AIDA SATOSHI
分类号 H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/06
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