发明名称 Semiconductor device and method of fabricating the same
摘要 An impurity-diffused layer having an extension structure is formed first by implanting Sb ion as an impurity for forming a pocket region; then by implanting N as a diffusion-suppressive substance so as to produce two peaks in the vicinity of the interface with a gate electrode and at an amorphous/crystal interface which serves as an defect interface generated by the impurity in the pocket region; and by carrying out ion implantations for forming an extension region and deep source and drain regions.
申请公布号 US2004004250(A1) 申请公布日期 2004.01.08
申请号 US20030465823 申请日期 2003.06.20
申请人 MOMIYAMA YOUICHI;OKABE KENICHI;SAIKI TAKASHI;FUKUTOME HIDENOBU 发明人 MOMIYAMA YOUICHI;OKABE KENICHI;SAIKI TAKASHI;FUKUTOME HIDENOBU
分类号 H01L21/265;H01L21/336;H01L21/8238;H01L27/092;H01L29/78;(IPC1-7):H01L21/336;H01L29/76 主分类号 H01L21/265
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