发明名称 A METHOD OF FORMING A SILICON DIOXIDE LAYER ON A CURVED SILICON SURFACE
摘要 The present invention refers to a method of forming a silicon dioxide layer by thermally oxidizing at least one monocrystalline silicon surface region on a semiconductor substrate, said silicon surface region having a curved surface. The present invention is advantageously applicable for the formation of the collar region in the upper part of the trench of a DRAM (Dynamic Random Acess Memory) cell. The method comprises the steps of providing a semiconductor substrate (1) having at least one monocrystalline silicon surface region having a curved surface, roughening the surface of said at least one monocrystalline silicon surface region so as to produce a layer of porous silicon, and thermally oxidizing (9) said at least one roughened monocrystalline silicon surface.
申请公布号 WO03036709(A3) 申请公布日期 2004.01.08
申请号 WO2002EP11689 申请日期 2002.10.18
申请人 INFINEON TECHNOLOGIES AG;BIRNER, ALBERT;GOLDBACH, MATTHIAS;SPERL, IRENE 发明人 BIRNER, ALBERT;GOLDBACH, MATTHIAS;SPERL, IRENE
分类号 H01L21/3063;H01L21/316;H01L21/8242;H01L27/108 主分类号 H01L21/3063
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