| 发明名称 |
Abtastpfadzelle |
| 摘要 |
A scan cell design includes a bypass mode in which the scan input (SI) of the cell is connected directly to the scan output of the cell by a connection that bypasses the scan memory (M1) of the cell. <IMAGE> |
| 申请公布号 |
DE69719416(T2) |
申请公布日期 |
2004.01.08 |
| 申请号 |
DE1997619416T |
申请日期 |
1997.04.08 |
| 申请人 |
TEXAS INSTRUMENTS INC., DALLAS |
发明人 |
WHETSEL, LEE |
| 分类号 |
G01R31/3185;(IPC1-7):G06F11/267;G01R31/318 |
主分类号 |
G01R31/3185 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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