发明名称
摘要 A gas shower unit (1) has a function of preliminary heating reactant gas to be passed therethrough, and is thus capable of causing uniform reaction within a semiconductor manufacturing apparatus and preventing through hole clogging and particle generation. The gas shower unit (1) has a base material of 5 mm or less in thickness and includes a sintered aluminum nitride base material (10) having a plurality of through holes (11) and a heater circuit pattern (12) or a plasma upper electrode (14) as a conductive layer formed in the sintered aluminum nitride base material (10). <IMAGE>
申请公布号 KR100413989(B1) 申请公布日期 2004.01.07
申请号 KR20010003083 申请日期 2001.01.19
申请人 发明人
分类号 C04B35/58;H01L21/02;C04B35/10;C04B35/581;C04B35/584;C04B37/00;C23C16/44;C23C16/455;H01J37/32;H01L21/205;H01L21/285;H01L21/302;H01L21/3065 主分类号 C04B35/58
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