发明名称 High throughput absolute flaw imaging
摘要 Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.
申请公布号 US2004004475(A1) 申请公布日期 2004.01.08
申请号 US20030419702 申请日期 2003.04.18
申请人 JENTEK SENSORS, INC. 发明人 GOLDFINE NEIL J.;ZILBERSTEIN VLADIMIR A.;CARGILL J. STEPHEN;SCHLICKER DARRELL E.;SHAY IAN C.;WASHABAUGH ANDREW P.;TSUKERNIK VLADIMIR;GRUNDY DAVID C.;WINDOLOSKI MARK D.
分类号 G01N27/82;G01N27/90;(IPC1-7):G01N27/90;G01R33/12 主分类号 G01N27/82
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