| 摘要 |
PURPOSE: A method for manufacturing a plastic test sample for an SEM is provided to prevent deformation and damage at an analyzing surface of the plastic test sample by cutting the plastic test sample through cooling the plastic test sample using liquefied nitrogen. CONSTITUTION: A test sample is obtained from a non-conductive plastic test sample by using a cutter having a cutting wheel. The test sample is cooled by using liquefied nitrogen. Then, the test sample is cut along an analyzing surface of the test sample. After that, the test sample is washed and dried so as to remove impurities from the test sample. A conductive metal is coated on the analyzing surface of the test sample. Then, the test sample is stored in a desiccator, which is isolated from external air. The cutting wheel of the cutter is made of Zr.
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