发明名称 |
IMPROVED SCANNING PROBE MICROSCOPE |
摘要 |
A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk. |
申请公布号 |
EP1377794(A1) |
申请公布日期 |
2004.01.07 |
申请号 |
EP20020806801 |
申请日期 |
2002.11.27 |
申请人 |
PSIA CORPORATION |
发明人 |
HONG, JAE-WAN;KWON, JOON-HYUNG;PARK, SANG-IL |
分类号 |
G01B7/34;G01B21/30;B82Y35/00;G01Q10/02;G01Q10/04;G01Q20/02;G01Q30/00;G01Q60/32;G01Q60/38;G01Q70/02;G01Q70/10;H01J37/26;(IPC1-7):G01B7/34 |
主分类号 |
G01B7/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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