发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE CAPABLE OF RESTRAINING PUNCH |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device capable of restraining punch is provided to be capable of restraining punch due to attacks of a lower layer without alteration the steps of processing. CONSTITUTION: A plug(44) is formed on a substrate(40) through the first insulating layer(41), the first etch stop layer(42) and the second insulating layer(43). The second etch stop layer(45) is formed on the plug(44). The third insulating layer(46) is formed on the second etch stop layer. An opening part(48) is formed to protrude the plug by selectively etching the third insulating layer, the second etch stop layer and the second insulating layer using the first etch stop layer as a stopper.
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申请公布号 |
KR20040001914(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020037248 |
申请日期 |
2002.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, YONG TAE;JANG, SEONG SU;YOO, JE HYEON |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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