发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to be capable of securing an open area at the inner portion of a contact hole when forming a metal pattern. CONSTITUTION: A gate oxide layer(21) and a gate pattern(22) are formed at the upper portion of a semiconductor substrate(20). The first and second spacer layers are formed at the upper portion of the resultant structure. The second spacer is formed by selectively etching the second spacer layer. After carrying out a predetermined ion implantation at the resultant structure, the second spacer is removed. An etching stop layer(25) and an insulating layer(26) are sequentially formed on the entire surface of the resultant structure. After forming a mask pattern at the upper portion of the insulating layer, a contact pattern(28) is formed at the resultant structure by carrying out an etching process.
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申请公布号 |
KR20040001536(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020036768 |
申请日期 |
2002.06.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, BYEONG SEOK;PARK, GYE SUN |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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