| 摘要 |
PURPOSE: A test mode control circuit is provided to minimize an external port and circuit for test and to enable a test in a board level installed with a chip. CONSTITUTION: A programming memory(21) supports a test mode operation and a user mode operation, and loads a test mode enable signal and an encoded test mode programming data to a test mode entry encoding signal, and then outputs it when being operated in a test mode. A system control part generates a test mode control signal to control test operation. And a test mode decoding part(22) outputs a test signal to provide test environment of a specific test mode by decoding the test mode entry encoding signal and the test mode control signal.
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