发明名称 |
METHOD OF REMOVING POLYMER OCCURRED IN ETCHING PROCESS |
摘要 |
PURPOSE: A method is provided to effectively removing polymer produced after etching process of a metallic layer. CONSTITUTION: In the first ashing process, a predetermined amount of NF3 gas plasma is applied to remove the polymer remaining on a metallic layer of silicon substrate(200). The polymer is further removed by a predetermined amount of O2 gas plasma in the second ashing process(300). Through the ashing process, the polymer is removed from organic strips(400). In the first ashing process, 35 sccm of NF3 gas is applied for 30 seconds.
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申请公布号 |
KR20040001037(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020036097 |
申请日期 |
2002.06.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAEK, YEONG MIN |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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