发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to be capable of improving reliability by forming a nitride layer on a capacitor insulating layer. CONSTITUTION: A lower electrode(24) is formed on a substrate(20) having a contact plug(23). A capacitor insulating layer(25) is formed on the resultant structure. The capacitor insulating layer(25) is planarized to expose the lower electrode(24). A nitride layer(26) is formed on the capacitor insulating layer by plasma activation energy using NH3 or N2 gas. A dielectric film(27) is formed on the lower electrode. An upper electrode(28) is formed on the dielectric film.
申请公布号 KR20040001891(A) 申请公布日期 2004.01.07
申请号 KR20020037225 申请日期 2002.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, NAM GYEONG;YUM, SEUNG JIN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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