发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to be capable of improving reliability by forming a nitride layer on a capacitor insulating layer. CONSTITUTION: A lower electrode(24) is formed on a substrate(20) having a contact plug(23). A capacitor insulating layer(25) is formed on the resultant structure. The capacitor insulating layer(25) is planarized to expose the lower electrode(24). A nitride layer(26) is formed on the capacitor insulating layer by plasma activation energy using NH3 or N2 gas. A dielectric film(27) is formed on the lower electrode. An upper electrode(28) is formed on the dielectric film.
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申请公布号 |
KR20040001891(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020037225 |
申请日期 |
2002.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, NAM GYEONG;YUM, SEUNG JIN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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地址 |
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