发明名称 Sti pull-down to control SiGe facet growth
摘要 A SiGe bipolar transistor including a semiconductor substrate having a collector and sub-collector region formed therein, wherein the collector and sub-collector are formed between isolation regions that are also present in the substrate is provided. Each isolation region includes a recessed surface and a non-recessed surface which are formed utilizing lithography and etching. A SiGe layer is formed on the substrate as well as the recessed non-recessed surfaces of each isolation region, the SiGe layer includes polycrystalline Si regions and a SiGe base region. A patterned insulator layer is formed on the SiGe base region; and an emitter is formed on the patterned insulator layer and in contact with the SiGe base region through an emitter window opening.
申请公布号 US6674102(B2) 申请公布日期 2004.01.06
申请号 US20010769640 申请日期 2001.01.25
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COOLBAUGH DOUGLAS DUANE;DUPUIS MARK D.;GALLAGHER MATTHEW D.;GEISS PETER J.;PHILIPS BRETT A.
分类号 H01L29/73;H01L21/20;H01L21/331;H01L29/732;H01L29/737;(IPC1-7):H01L29/737 主分类号 H01L29/73
代理机构 代理人
主权项
地址